| Inductance Range |
L-LO: 0.01μH~1μH L-HI: 1μH~100μH Two-Range Switching |
| Test Voltage Range |
1V~300V |
3V~1000V |
| Voltage Setting Resolution |
0.1V step |
0.3V step |
| Minimum Measurement Voltage Resolution |
0.2V/dgt |
1.0V/dgt |
| Maximum Applied Voltage (Approx.) |
See the “Maximum Applied Voltage Range (Target Values)” Graph |
| Maximum Output Voltage (No Load) |
L-LO: 5000V L-HI: 2500V Two-Range Switching |
| Waveform Sampling Resolution |
300MHz・3.333nsec 12bit |
| Sampling Range (Width) |
7 Ranges, Manual Switching |
| Number of Applied Pulses (Pulse) |
PreCheck: 1 Pulse Test Pulses: 16 Pulses |
| Minimum Test Time (1 Pulse, No Screen Display) |
High-Speed Mode: With judgment: 18 ms Without judgment: 10 ms
Tester Mode: With screen display: 108 ms Without screen display: 53 ms |
| Judgment Items / Output Signal (When the option is installed) |
[Standard Judgment Items]
• Test judgment: OK / NG
• Area: NG
• Waveform Difference Area (Dif Area): NG
• Peak Voltage Variation (PeakStb): NG
• Laplacian: NG
• Attenuation Rate (Qatt): NG
• Contact Check (PreCheck): CE
[Option: Individual I/O Output for Each Judgment Item]
For each of the above judgment items (Area, Dif Area, PeakStb, Laplacian, and Qatt), the judgment result (NG) can be individually output to external equipment as an I/O signal. |
| Test Circuit |
4-Terminal |
| Test Cable Length Range |
Recommended: 1.6 m |
| Additional Functions |
Master waveform storage capacity: 196 models; expandable via CF memory card; external control via RS-232C and I/O; test result log storage and screen hard-copy storage |
| External I/O Control Signals |
Application Trigger (Trig), Application End (Index), etc.
Supports high-speed interface timing for inspection handlers. |
External Dimensions (excluding the carry handle) |
345(W)×185(H)×360(D) |
| Power Supply Voltage |
AC100/115/220/240 ±5% (Factory Setting at Shipment) |
| Options |
Test Cables / Various Fixtures / Individual I/O Output for Each Judgment Item |